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1° Day, June 14

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11.00 Opening Remarks

Elio Bava, President of the National Institute of Metrological Research (INRIM),

Elvio Mantovani, Managing Director AIRI/NanotecIT,

Bruno Rebaglia, UNI (Italian Organization for Standardization) Working Group "Terminology", Regulation in nanotechnology and metrology

11.30-15.00 Nanofabrication, top-down techniques, nanoelectronics, quantum devices

Florestano Evangelisti, CNR Institute of Photonics and Nanotechnology
Mesoscopic physics and quantum devices (slides)

Fabrizio Giacometti, Pirelli Labs SpA
Nanometrology for optical structures in Silicon on Insulator (slides)

Giuseppe Milano, Modeling Lab. for Nanostructure and Catalysis, Chemical Dep., University of Salerno
Multiscale Modelling and nanofabrication (slides)

Marco Peroni, Selex Sistemi Integrati SpA
Nanolitography for high speed electronic components in composite semiconductors (slides)

13.00-14.20 Lunch and poster session

Anna Morra, STMicroeletronics, Post Silicon Tecnhnology Division
Soft and Nano-lithographies in organic electronics and memories (slides)

Michele Giordano, CNR Institute for Composite and Biomedical Materials
Sensors based on photonic crystals and polymers

15.00-18.20 Surfaces, layers and atomic scale metrology

Guenter Wilkening, Precision Engineering Division, Physikalisch-Technische Bundesanstalt, Braunschweig, Germany
Scanning Force Microscopy for Dimensional Metrology

Enrico Massa, National Institute for Metrological Research- INRIM
Atomic scale Metrology at INRIM

15.50-17.00 Coffee break and poster session

Stefano Prato et al, APE Research Srl
Near field Techniques and Surface Metrology

Maurizio Vannoni, CNR National Institute of Applied Optics
New approaches towards nanometre accuracy in absolute planarity measurements (slides)

Alberto Pasquini, Sorin Biomedica Cardio Srl
Sub-micron dimensional characterizations in biomedical devices (slides)

Paolo Colombi, INSTM and Chemistry for Technologies Lab., University of Brescia
Metrology for Nanoscale Properties: X-ray methods

2° Day, June

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9.00 Opening remarks

9.15-11.00 Nanostructured materials, nanocomposites, particles analysis

Stefano Bellucci, INFN-Laboratori Nazionali di Frascati
Screening Electromagnetic Interference Effects using Nanocomposites based on Carbon Nanotubes

Nello Li Pira, Centro Ricerche Fiat SCpA
Electro-optical and morphological analysis of nanostructures for applications in automotive display

Andrea Goldoni, Sincrotrone Trieste SCpA
Quantitative measurements of the Interaction of Single-Wall Carbon Nanotubes with Gas Phase Molecules

Massimo Pasquale, National Institute of Metrological Research- INRIM
Characterization of nanostructures

Daniele Bonacchi, Centro Ricerche Colorobbia SpA
Determination of gold and cobalt ferrite nanoparticles average size using different analytical techniques

Stefano Cesare, Thales Alenia Space
Nanobalance: a test facility for micro-propulsion devices

11.00-15.00 Interdisciplinary techniques

Giampiero Amato, National Institute of Metrological Research- INRIM
Quantum Dots for biomedical imaging

Marco Lazzarino, TASC National Laboratory
Determination of the "Effective" Size of Bio-Molecules: New Strategies on the Nano-Scale

12.15-13.20 Lunch and poster session

Michele Muccini, CNR-ISMN, Institute for the Study of Nanostructured Materials,
Optical nanoprobes for soft matter and molecular electronics

Michael Först, RWTH Aachen University, Institut für Halbleitertechnik, Aachen, Germany
High-resolution medical imaging by optical coherence tomography

Spartaco Santi, CNR-IGM, Institute of Molecular Genetics
Measurement and Analysis of Fluorescence Imaging in Neuroscience (slides)