The book of abstracts of the workshop is now available on this website for download.
Book of abstracts
The interest for nanotechnology and its applications is going to keep growing steadily, but both R&D activity and its translation into product for the market are hampered by the lack of a consolidated framework of metrology techniques at nanoscale and related measurement standards . The solution of this problem is made more complex by the multi-disciplinary and multi- sectoral character of nanotechnology and not by chance, nanometrology is an important area in FP7.
An open dialogue and cooperation between industry and the metrology community is fundamental to highlight the relevant problems and needs of metrology in the various areas of application of nanotechnology as well as the contribution that the research community can offer to solve these problems.
The workshop, organized in 2004 by AIRI/Nanotec IT and INRIM, was aimed at this goal. The success of that initiative, prompted by the content of the presentations, the variety of the participants, and the opportunity for contacts offered, has suggested to replicate the event.
This new workshop will be, as the previous one, application-oriented and it will focus on real industrial experiences and needs . It will bring together industrial users and experts from the national metrology community and also some prominent international experts to discuss both needs in nanometrology and recent developments with reference to techniques and methods of measurement, instrumentation and standards . The attention will concentrate on the sectors of major interest at national level to favour synergies and cooperation.
The program will also consider topics related to safety issues and an updating of present trends on regulations and documentary standards.
The two days event will tackle an ample spectrum of themes relevant in nanometrology and the presentations will be grouped in four successive sessions:
The Interdisciplinary techniques session will consider measurement problems arising from the convergence of different technologies and application
Many can gain from attending the Workshop. Academic researchers could spot possible themes of research to focus on, industry people get information on the state of the art of the research in nanometrology and other industrial needs, suppliers of equipments/instrumentation, representatives of regulatory bodies, planners (from industry and public) will get valuable indications, useful to address their strategic choices.
The workshop will exhibit a poster session aimed at encouraging the exchange of information and to enrich the panorama of R&D activities going on in the field. The poster session will be open to the delegates throughout the workshop.
Those interested to present a poster must send an abstract illustrating their contribution to the Secretary of the Workshop not later than May 11th 2007.
Please use the dedicated template to compile your abstract (download abstract template).
-The abstract must be in english
-A black&white image can be added if needed.
-All information sent must not exceed one page lenght (verdana, font 10).
The acceptance of the poster will be communicated to the author by May 25th 2007. The abstracts of the poster accepted will be included in the proceeding of the workshop.
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